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D8 Advance型X射线衍射仪

作者:        发布于:2011-03-25

  

    型号: D8 Advance

  生产国别厂家:德国Bruker公司

  主要技术指标:

      额定输出功率3kW;

      电流电压稳定度优于±0.005%;

      高精度步径式马达控制双圆测角仪,测角仪半径≥200mm,2θ转动范围-10°~168°,可读最小步长0.0001°,角度重现性0.0001°;林格斯一维探测器,动态范围>1×109cps,背景<0.1cps

  主要用途:

      1. 物相定性分析(粉体、块体与薄膜等)

      2. 物相定量分析

      3. 精确测定点阵常数

      4. 晶粒大小及晶格畸变测定

      5. 颗粒大小及其分布测试

      6. 薄膜厚度(<100nm)及粗糙度测试

      7. 物质相变测定

  Specifications:

      X-Ray Source: Non-monochromated Cu Kα X-Ray

                     (Running condition : 40kV, 40mA)

                     (Rated output power: 3kW, Current and Voltage Stability: <±0.005%)

      Detectors: NaI Scintillation counter detector

                   LynxEye 1D detector(dynamic range>1×109cps,background<0.1cps)

       Optics: Both Bragg-Brentano and Parallel Beam Geometry

               Gobel Mirror

      Goniometer: High precision microprocessor controlled, two circle goniometer with independent stepper motors and optical encoders; Goniometer radius: ≧200mm; 2θ: -10°~168°

                   Smallest angular step size: 0.0001°

                   Reproducibility : 0.0001°

      Sample Stage:Standard Stage

                     XYZ motorized sample stage with Vacuum Chuck

                     Motorizing Rotating Reflection & Transmission Sample Stage

      Attachement:  High Temperature MRI stage (RT-1600°C)

                      Low Temperature MRI stage (-180-450°C)

  Application:

         Phase Identification (Powder, block and Thin Film)

         Phase Quantitative Analysis

         Structure Refinement

         Precise determination of lattice constants

         Determination of crystalline size and lattice distortion

         Small Angle X-Ray Scattering Determination of Particle Size and Size Distribution

         Thin Film Analysis : Roughness, Thickness(<100nm)

         In-situ Phase Change Detect under High Temperature Conditions

  

    

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